Perform EMC validation and robustness testing with a low-cost, portable bench top unit. Our CAN-based LVTGO-VBS family of low-voltage battery simulators allows you to easily perform robustness and validation testing as well as EMC standards testing. Tests to standards published by JLR, Ford, VW, BMW, GM, Fiat Chrysler and Mercedes Benz or any published standard are performed.
LVTGO waveforms include cranking and stop/start voltages, voltage dropouts, fast transient burst noise (FTBN), and other waveforms. Major published standards are included in the library and others can be easily added.
Exhaustive testing goes beyond standards testing and is included with all LVTGOs. Exhaustive testing uses randomization techniques and is about testing for those unexpected conditions not normally tested for and, therefore, not found. Randomization allows you to not only do exhaustive testing, but also zero in on areas of interest. This substantially increases test coverage and results in a much more robust system design prior to production.
Test runs can be run unattended overnight, over weekends or longer.
Exhaustive testing subjects ECUs to a lifetime of fault conditions over and above basic standards.
- ECU robustness, stability and standards testing during engineering development: electrical subsystems or whole vehicle, as required
- Peak voltage options of 20V, 30V, 60V or 80V for testing 12V, 24V, 27V or 48V systems
- ECU failure mode testing
- Cranking waveform generation
- Hardware-in-the-Loop (HIL) testing
- Overnight, weekend or longer tests
Testing to Standards
- ISO 16750
- General Motors GMW3172
- Ford CI210, 220, 260, 270
- FCA DC-10615, CS00054
- Mercedes-Benz LV124
- Jaguar LandRover CI210, 220, 230, 265
- BMW, VW, and others
- 100% repeatable randomized complex waveforms
- Configurable triggering options
- Detailed state reporting via CAN
- Entire vehicle tests
- High current output
- Microprocessor-based control
- PC Windows hosted and controlled via CAN: License is node-locked or via dongle
- Standard slew rate (rise/fall) of 500 μSec, optional MicroCUT slew rate in order of 3 μSec
- 200 nSec rise/fall per the newest GMW3172 spec. in development
- Cranking or start/stop simulation
- Fast transient burst modes
- Multi-step square waves
- Ramp testing, programmable slew rates (rise or fall) as low as 3 μSec with programmable values of 10 μSec, 500 μSec or as long as several days
- Discharge simulation
- Constant voltage
- Programmable random variation for robustness
- Excellent Visual Basic interface for automated runs
- CAN bus configurable
- Alternative input triggers
- Multiple Independently-programmable